Equipment - Spectrum Analyzers

VIBRATION TEST CONTROL SYSTEMS, DATA RECORDING SYSTEMS, SPECTRUM ANALYZERS, VERIFICATION AND CALIBRATION SYSTEMS, ACOUSTIC EQUIPMENT, AMPLIFIERS, SENSORS

Semiconductor front end metrology equipment: optical metrology series for film thickness & properties, and optical critical dimensions; plus X-ray metrology series for film thicknesses, material properties and compositions, surface contamination.

Semiconductor Curve Tracer, B-H Analyzers, Isolation System, Oscilloscopes, Isolatoin Probe, Oscilloscope Accessories, Delay Pattern Generator (six-channel pulse generator), Signal Generators, Universal Counters

EUV light sources for lithography and optics research and development.

Gas analysis systems and mass spectrometers