Probe Card Maintenance and Analysis Systems

Probe cards: MEMSFlex™ Direct Dock, Trio™ Vertical, Vertical Space Transformers, CMOS Image Sensor, LCD Driver, Venture™ Cantilever, Ceramic Blade Cards, MetrologyB3™ Vertical Probe Cards

Probe cards, test sockets, different types of microchip and electronic components test equipment to conduct tests and measurements under various conditions.

Provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.Probe Systems, Probes, Probe Cards, Metrology, Quantum Cryogenics.

Semiconductor Curve Tracer, B-H Analyzers, Isolation System, Oscilloscopes, Isolatoin Probe, Oscilloscope Accessories, Delay Pattern Generator (six-channel pulse generator), Signal Generators, Universal Counters

Probe cards, wafer prober and test sockets for semicoductor test, and providing equipment (testers, probe unit and prober) for array inspection, TEG test, Open/Short test, cell panel inspection and repair equipment for FPD.

Probe cards, test boards, maintenance service.

Test, analysis, and repair of IC probe cards, metrology and inspection solutions for industry. Solutions for dynamic testing of power semiconductors.

High performance wafer probers and cantilever probe cards

Hi-End Probe Card PCB, Package test Load Board PCB Micro-Pitch extend solution ( MVP, MLO ) Probe card test Worx, PRVX, PB Mother Board Interface kit for ATE. Semiconductor test service for Analog IC, Digital IC, Hi-Power IC, Mixed IC

Systems and consumables, tools for Wafer Fab, Wafer Sort, Wafer Probe, Wafer Test, Final Test, Assembly and Backend. Epoxy-Cantiler Probe Cards, Probe Card Specials, Miniprober. Repairs to all kind of Standard and Advanced Probe Cards.

Multi-spectral imaging systems for defect inspection & metrology using IR, visible, & UV spectrums for Semiconductor, Photonics, Medical Device, MEMS, Aerospace, Defense, & Data Storage.

Manufacture non-contact testers, printed board electric inspection systems, liquid crystal electric inspection systems, and semiconductor testers