CV (capacitance-to-voltage) Probe systems

Electronic test and measurement equipment.

Semiconductor Curve Tracer, B-H Analyzers, Isolation System, Oscilloscopes, Isolatoin Probe, Oscilloscope Accessories, Delay Pattern Generator (six-channel pulse generator), Signal Generators, Universal Counters

intelligent sensing platforms for radio-frequency (RF) and plasma process monitoring. Our products find applications in fundamental research, process development, tool design, process control and fault detection and classification (FDC).

Probe stations and accessoires

Non-contact, non-destructive, in-process and post-process measurement and mapping of sheet resistance and carrier mobility of semiconducting and conducting layers and thin films on semiconducting and insulation substrates

Manufacture non-contact testers, printed board electric inspection systems, liquid crystal electric inspection systems, and semiconductor testers

Semiconductor and thin film measuring systems

Four-point-probe and non-contact eddy-current measurement equipment manufacturer in resistivity and sheet resistance measurement equipment for the semiconductor and display industry.