Defect; Particle; Contam. Detection/Review/Inspect.

Semiconductor and FPD Equip: Non-Pattern Surface Inspection System (WM series), Pattern Inspection System (Vi series), Bump Height Inspection System, TSV / Trench Depth Measurement System, Proximity Exposure System (TME series), Visual Inspection System.

Real-time in-line monitoring of trace amounts of metallic contamination. Total solution of metallic, organic and ionic contamination monitoring for gases, chemicals and wafers in the semiconductor ecosystem

AI Vision Solution, AOI Solution(DISPLAY/ Secondary Battery/ Semiconductor/ Automobile, etc.), LASER Solution

Hybrid-pixel X-ray and electron detectors

Laser marking, dicing and scribing equipment for wafers, wafer thickness measurement equipment, substrate defect detection machine

Semiconductor inspection equipment, Various lamps, Light source equipment

MicroQuick Particle Scanner for Parts Cleanliness Testing and Characterization

specialized products and services that improve the utilization, efficiency and life cycle of semiconductors manufacturing equipment. eClean Process Kit Cleaning Ultra Kit Novellus Injector Tube Probe Cassette Probe Injector Tube Probe Pencil Pr

Surface particle measurements at microscale

Lithography equipment Process equipment, Testing Equipment, Photolithography Equipment, Sol wafer

optical measurement and inspection equipment and solutions for the compound semiconductor,optoelectronic and integrated circuit industries.

Mueller matrix measurement systems for determining the polarization properties of materials and optical components, applications ranging from birefringence mapping and polarizer testing to LCD cell gap testing and thin-film measurements.

Advanced Process Control and Yield Management Software. Defect Inspection and Metrology Systems. Epi Thickness & Composition. Lithography Systems.

Laser optical scanning systems enable full-surface defect detection, mapping, and classification on transparent, translucent, and opaque substrates of any shape.

Defect detection on wafers, crystal slip defect detection, wafer geometry inspection, UV curing system.

Analysis, Measurement and evaluation services: physical and chemical analysis of semiconductor device, FPD and media; Environment evaluation of the clean room. Semiconductor measurement, inspection and sorting systems: lifetime; wafer edge profiler.

Semiconductor/MEMS metrology and inspection equipment.

AOI (Automatic Optical Inspection) equipment for FPD and semiconductor products.

Manufacturers of X-ray analysis, thermal analysis and non-destructive testing instruments.

Vison Inspection System, Wafer Measurement System, Wafer Handling System