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Microscopes: Atomic Force Microscopes (AFM)

Atomic Force Microscopes (AFMs) are advanced microscopes that are used to measure and image the topography of a sample at a nanoscale level. They work based on the principle of scanning probe microscopy, where a tiny probe is used to physically interact with the sample and collect data on its surface features. The probe, which is attached to a cantilever, scans the sample surface and records information about its height and shape by measuring the forces between the probe and the sample. The resulting data can be used to create a three-dimensional image of the sample surface with nanometer-level resolution. AFMs are used in a variety of applications, including material science, biology, and semiconductor manufacturing.

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Nanophoton Corporation

, JP Manufacturer

Raman microscopes

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Nikon Metrology Europe NV

, BE Manufacturer

X-ray and CT Systems, Laser Radar Measuring Systems, 3D Laser Scanners, CNC Video Measuring Systems, Optical Manual Measuring, Industrial Microscopy

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Oxford Instruments

, GB Manufacturer

Plasma assisted etch and deposition solutions. Failure analysis tools. Inspection and process control equipment.

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KMLabs

, US Manufacturer

high power, highest performance femtosecond laser systems and the market definer for tabletop-scale coherent EUV and x-ray sources

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Infinitesima Limited

, GB Manufacturer

Atomic force 3D surface measurement technique, the Rapid Probe Microscope.

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Park Systems Corp.

, KR Manufacturer

Atomic Force Microscopes (AFM)

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PhaseView

, FR Manufacturer

Advanced 3D Microscopy & Scientific Imaging

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