Resistivity Measurement; 4 point probe; Sheet resistance

Fast, nondestructive, electrical characterization tools under production conditions, measuring parameters like minority carrier lifetime, photoconductivity and resistivity.

Test equipment for ferroelectric materials of all types. PiezoMEMS Analyzer, Ferroelectric Tester.

Mask Aligners, UV Exposure Systems, Solar & Photovoltaic, UV Meters, Resistivity Meters

Electronic test and measurement equipment.

Semiconductor Curve Tracer, B-H Analyzers, Isolation System, Oscilloscopes, Isolatoin Probe, Oscilloscope Accessories, Delay Pattern Generator (six-channel pulse generator), Signal Generators, Universal Counters

intelligent sensing platforms for radio-frequency (RF) and plasma process monitoring. Our products find applications in fundamental research, process development, tool design, process control and fault detection and classification (FDC).

Design and production of probing and inspection systems to the semiconductor industry.

Probe cards, wafer prober and test sockets for semicoductor test, and providing equipment (testers, probe unit and prober) for array inspection, TEG test, Open/Short test, cell panel inspection and repair equipment for FPD.

Probe stations and accessoires

Measurement tools for the Semiconductor and PV in process control and laboratory characterization. Contactless metrology tools for 1" up to 450mm silicon, quartz, sappphire wafers and plastic display materials.

Equipment for printing electronics and thin functional films research. Semiconductor measurement and characterization equipment.

Non-contact, non-destructive, in-process and post-process measurement and mapping of sheet resistance and carrier mobility of semiconducting and conducting layers and thin films on semiconducting and insulation substrates

Film thickness measurement, optical profiler, sheet resistance measurement systems.

Non-contact sheet resistance meters, 4-point probes. Vacuum ready components.

3D Interferometry Microscope for sub-nanometer to millimeter surface profiling. Precision measurement for Semiconductor, MEMS, PV cell, Surface Engineering, OLED, etc.

Wafer geometry metrology systems, precision capacitive sensors, vibrating sample magnetometers and magneto-optical Kerr effect (MOKE) tools

Die and wire bonding tools, fluid and solder dispencing tools, manual die bonders, 4-point probes.

Semiconductor and thin film measuring systems

Solutions of measurements with contactless surface measurement methods for the semiconductor, display, and other precision mechanics industries. NanoSystem has built up the core technology of contactless 2D and 3D measurement and inspection systems.

Four-point-probe and non-contact eddy-current measurement equipment manufacturer in resistivity and sheet resistance measurement equipment for the semiconductor and display industry.