Freiberg Instruments GmbH

 , DE Manufacturer
Fast, nondestructive, electrical characterization tools under production conditions, measuring parameters like minority carrier lifetime, photoconductivity and resistivity.

Axometrics, Inc

 , US Manufacturer
Mueller matrix measurement systems for determining the polarization properties of materials and optical components, applications ranging from birefringence mapping and polarizer testing to LCD cell gap testing and thin-film measurements.

Kobelco Research Institute Inc.

 , JP Manufacturer,  Service Company
Analysis, Measurement and evaluation services: physical and chemical analysis of semiconductor device, FPD and media; Environment evaluation of the clean room. Semiconductor measurement, inspection and sorting systems: lifetime; wafer edge profiler.

Semilab LEI

 , US Manufacturer
Non-contact, non-destructive, in-process and post-process measurement and mapping of sheet resistance and carrier mobility of semiconducting and conducting layers and thin films on semiconducting and insulation substrates

Zhenjiang Chaona Subnano Instrument Co., Ltd

 , CN Manufacturer
3D Interferometry Microscope for sub-nanometer to millimeter surface profiling. Precision measurement for Semiconductor, MEMS, PV cell, Surface Engineering, OLED, etc.