Freiberg Instruments GmbH
, DE Manufacturer
Fast, nondestructive, electrical characterization tools under production conditions, measuring parameters like minority carrier lifetime, photoconductivity and resistivity.
Axometrics, Inc
, US Manufacturer
Mueller matrix measurement systems for determining the polarization properties of materials and optical components, applications ranging from birefringence mapping and polarizer testing to LCD cell gap testing and thin-film measurements.
Kobelco Research Institute Inc.
, JP Manufacturer, Service Company
Analysis, Measurement and evaluation services: physical and chemical analysis of semiconductor device, FPD and media; Environment evaluation of the clean room. Semiconductor measurement, inspection and sorting systems: lifetime; wafer edge profiler.
Semilab LEI
, US Manufacturer
Non-contact, non-destructive, in-process and post-process measurement and mapping of sheet resistance and carrier mobility of semiconducting and conducting layers and thin films on semiconducting and insulation substrates
Zhenjiang Chaona Subnano Instrument Co., Ltd
, CN Manufacturer
3D Interferometry Microscope for sub-nanometer to millimeter surface profiling. Precision measurement for Semiconductor, MEMS, PV cell, Surface Engineering, OLED, etc.