Crystal Defect Detector

AI Vision Solution, AOI Solution(DISPLAY/ Secondary Battery/ Semiconductor/ Automobile, etc.), LASER Solution

Laser marking, dicing and scribing equipment for wafers, wafer thickness measurement equipment, substrate defect detection machine

Semiconductor inspection equipment, Various lamps, Light source equipment

Semiconductor front end metrology equipment: optical metrology series for film thickness & properties, and optical critical dimensions; plus X-ray metrology series for film thicknesses, material properties and compositions, surface contamination.

optical measurement and inspection equipment and solutions for the compound semiconductor,optoelectronic and integrated circuit industries.

Mueller matrix measurement systems for determining the polarization properties of materials and optical components, applications ranging from birefringence mapping and polarizer testing to LCD cell gap testing and thin-film measurements.

Laser optical scanning systems enable full-surface defect detection, mapping, and classification on transparent, translucent, and opaque substrates of any shape.

Defect detection on wafers, crystal slip defect detection, wafer geometry inspection, UV curing system.

Measuring Systems & Measuring Tasks, Measuring Systems, Wafer Inspection, MEMS Inspection, WAFERinspect AOI, Confocal Microscopy

Semiconductor/MEMS metrology and inspection equipment.

Wafer optical metrology tools for the semiconductor industry.

Overlay metrology in lithography, wafer backside defect inspection, wafer level package inspection equipment.

Wafer optical inspection systems