Defect Inspector

AI Vision Solution, AOI Solution(DISPLAY/ Secondary Battery/ Semiconductor/ Automobile, etc.), LASER Solution

LED/OLED Equipment: Wireless logistics, Micro LED Chip AOI Inspector, Dispenser, PAD Cleaner, COG FOG AOI. Semiconductor: Mount Inspector, Wire Bonding, Die Attach, Wafer Warpage, WRS Inspector, STOCKER system, Wafer Edge, Macro Tower Lifter, STB, Rail.

Laser marking, dicing and scribing equipment for wafers, wafer thickness measurement equipment, substrate defect detection machine

Semiconductor inspection equipment, Various lamps, Light source equipment

Semiconductor front end metrology equipment: optical metrology series for film thickness & properties, and optical critical dimensions; plus X-ray metrology series for film thicknesses, material properties and compositions, surface contamination.

BEOL semiconductor equipment: laser marking, wafer inspection, wafer jet deflashing systems, tape and reel machines. Test handlers, pick and place inspection, trim/sort machines,

automatic vision inspection that is dedicated to Semicon backend front of line operations. We have the world's first 3D inspection running in mass production.

optical measurement and inspection equipment and solutions for the compound semiconductor,optoelectronic and integrated circuit industries.

Advanced Process Control and Yield Management Software. Defect Inspection and Metrology Systems. Epi Thickness & Composition. Lithography Systems.

Defect detection on wafers, crystal slip defect detection, wafer geometry inspection, UV curing system.

Analysis, Measurement and evaluation services: physical and chemical analysis of semiconductor device, FPD and media; Environment evaluation of the clean room. Semiconductor measurement, inspection and sorting systems: lifetime; wafer edge profiler.

Wafer Scrubber, Wafer Spray Etcher, Wafer Backside Cleaner Solvent and Flux Cleaner, Frame cleaner, Solar Equipment, Double-side inspector w/ink, Substrate Mapping Tracking Machine, OM Visual Inspection, Chips Counting Machine.

Semiconductor/MEMS metrology and inspection equipment.

AOI (Automatic Optical Inspection) equipment for FPD and semiconductor products.

Wafer, Reticle and Package Inspection Systems. Lasrer Marking Systems. Auto Scope System.

Manufacturers of X-ray analysis, thermal analysis and non-destructive testing instruments.

Wafer-Level Chip Scale Packaging Inspection & Sort, Integrated Tray-based Scan-Pack, High Speed Tray Taping Machine, Turret-based Scan-Pack Wafer Inspection Machine

Vison Inspection System, Wafer Measurement System, Wafer Handling System

Overlay metrology in lithography, wafer backside defect inspection, wafer level package inspection equipment.

Wafer optical inspection systems