ClassOne is one very special equipment manufacturer, delivering new advanced wet-chemical process tools especially for the cost-sensitive producers of MEMS, Power Devices, RF, LEDs, Photonics, Sensors and other emerging technologies. Class One provide innovative new solutions for a range of applications on 3" to 8" substrates of many materials, including silicon, glass, sapphire, GaAs, GaN, Ge, InP and HgCdTe. ClassOne make Solstice electroplating tools for development and high-volume production, batch spray solvent processors, spin rinse dryers, process controllers and more. Furthermore ClassOne is a leading supplier of high quality Semitool refurbished equipment.
ClassOne provide a turn-key solution which includes refurbishment, warranty, installation by trained technicians and full support including spare parts and field service. The ClassOne Technology Product Line includes semi-automatic and fully automated equipments as well as spray batch and SRD tools
SEMI AUTOMATIC SOLSTICE LT ELECTROPLATING TOOL
Psk DAS series
FULLY AUTOMATIC SOLSTICE S4/S8 ELECTROPLATING TOOL
Psk DAS series
TRIDENT SPRAY SOLVENT TOOL
Psk DAS series
TRIDENT SPIN RINSE DRYERS
ClassOne Equipment offers high quality refurbished KLA-Tencor, Semitool, SUSS Microtec, EVG, SPTS, Oxford Instruments, and Plasmatherm equipment. We provide a turn-key solution which includes full refurbishment, 3, 6 and 12 month warranty, and professional installation and training by experienced factory trained technicians. ClassOne Equipment offers spare parts and field service support on all core tool sets. 203 Equipment, Inspection & Measurement Defect: Particle: Bump: Contamination Detection, Review or Inspection Line Width: Critical Dimension (CD) Measurement Microscopes: Atomic Force Microscopes (AFM) Microscopes: Scanning Electron Microscope (SEM): Focused Ion Beam (FIB), Transmission Electron Microscope (TEM) Overlay Measurement Resistivity Measurement: 4 Point Probe: Sheet Resistance Stress: Refractive Index: Reflectivity & Conductivity Measurement Wafer: Substrate Metrology: Topology: Nanotopography: Flatness Measurement: Crystalline Orientation 204 Equipment, MEMS Deep RIE Etching: Dry Etching Double Sided Mask Aligner Wafer Level Bonders 205 Equipment, Nanotechnology Equipment: Nanotechnology Tools 207 Equipment, Process Cleaning: Washing: Drying Equipment for Substrate, Fab Processing Deposition: Chemical Vapor (CVD): MOCVD: PECVD: LPCVD: ALD: REALD: MVD Etching: Stripping: Ashing - Dry and Wet Equipment Lithography: Exposure: Aligners: Direct Write Systems: Steppers: Scanners: Nanoimprint Plating: Electro Chemical Plating: Deposition Systems
