Calibration & Reference Standards

Multiproduct Calibrators, Precision Multimeters, Electrical Test Equipment Calibrator, References & Standards, Calibration Software, Portable Test Equipment, Calibration Services

Mask Aligners, UV Exposure Systems, Solar & Photovoltaic, UV Meters, Resistivity Meters

Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003) -- ASTM F1618-02 View Specs Standards and Technical Documents - Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers

Thin film equipment supplier in Sydney Australia.

Mueller matrix measurement systems for determining the polarization properties of materials and optical components, applications ranging from birefringence mapping and polarizer testing to LCD cell gap testing and thin-film measurements.

Calibration standards and references. Contamination, profilometry, film thickness, electrical, surface topography calibration products. Traceable Advanced Lithography Products for CD-SEM and CD-AFM.

RF power meters, electrical bonds meter, temperature and calibration products, RF power sensors.

Ultrasonic transducers and generators, transducer test systems, optical displacement measurement systems, alignment laser.

Integrated photonics foundry, supplier of products for microscopy and spectroscopy applications.

Contamination control. Particle counting instruments.