Founded in August 1998, Boin GmbH develops software solutions for the semiconductor industry and provides services such as the development of complex mathematical algorithms. The company was started based on a business plan which won 2nd prize in a business plan competition known as "StartUp". This is a nation-wide competiton of business plans initiated by the german magazine "Stern", the banking association Sparkasse, and the consultants McKinsey & Company.

Boin GmbH´s focus is to develop advanced metrology software for the semiconductor industry. The company continues to develop long-term partnerships with IC and semiconductor manufacturing equipment vendors worldwide. Boin GmbH has already established relationships to clients such as Infineon, KLA-Tencor, Philips, Sopra, Mattson, Varian, Wacker Siltronic, Carl Zeiss, LSI Logic and others.

Since April of 1999, Hologenix Inc. has been distributing our main product WAFERMAP in the US and Canada. In August, 1999 we announced the expansion of our global distribution network for WAFERMAP. The product is now directly marketed and sold in Germany, France, Switzerland, UK and other European countries by the J. P. Kummer group. In April of 2000, Nanyang Equipment Pte. Ltd. was selected as the exclusive distributor in ASEAN, China, India and Taiwan.

WAFERMAP is an award winning software package used to collect, edit, analyze and visualize measured physical parameters on semiconductor wafers. WAFERMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
Several kinds of operations can be applied to the wafer maps such as rotation, shifting of the grid in the X or Y direction, or mirroring the data along the X or Y axis. Global operations such as adding or subtracting a constant or taking the 1st or 2nd derivative can be carried out.
A Sigma Filter allows for the elimination of sites that exceed a user-defined range (e.g. measurement errors). It is also possible to compare different sets of data by adding, subtracting or dividing entire wafer maps. Typical applications include map generation for manually operated metrology tools and standardized visualization for different automatic metrology equipment (e.g. different types of four point probes in the same fab). WAFERMAP allows users to work off-line and to analyze and edit metrology data outside of the clean room. It's the perfect solution for paperless fabs.

PANELMAP is a software package used to collect, edit, analyze and visualize measured physical parameters on rectangular semiconductor panels. PANELMAP can import data files from various metrology tools such as ellipsometers, thickness gauges and four point probes. The imported data can then be visualized or printed as line scans, contour plots, 2D or 3D plots or as a histogram.
Several kinds of operations can be applied to the panel maps such as shifting of the grid in the X or Y direction, rotation, or mirroring the data along the X or Y axis. Global operations such as adding or subtracting a constant or taking the 1st or 2nd derivative can be carried out.
A Sigma Filter allows for the elimination of sites that exceed a user-defined range (e.g. measurement errors). It is also possible to compare different sets of data by adding, subtracting or dividing entire panel maps. Typical applications include map generation for manually operated metrology tools and standardized visualization for different automatic metrology equipment (e.g. different types of four point probes in the same fab). PANELMAP allows users to work off-line and to analyze and edit metrology data outside of the clean room. It’s the perfect solution for paperless fabs.

 

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