Yield Management

Manufacturing Execution System (MES), Statistical Process Control (SPC), Equipment Automation Program (EAP), Receipt Management System (RMS), Data Analysis System (EDA), Fault Detection & Classification(FDC) and Master Data Management (MDM).

Advanced Process Control and Yield Management Software. Defect Inspection and Metrology Systems. Epi Thickness & Composition. Lithography Systems.

Physics and machine learning enabled software solutions for manufacturing and process industries.

Software solutions to improve manufacturing efficiency and chip yield.

Wafer slicing, dicing, grinding and polishing equipment and blades. Probing machines. CMP Equipment. Precision measuring equipment.

EDA, plant automation and manufacturing software for semiconductor and electronics industry.

Developer and manufacturer of high-end inspection and metrology equipment for the semiconductor industry.