Aging tests are performed on semiconductor components to evaluate their performance and reliability over a period of time, usually under stress conditions such as high temperature, voltage or current. The objective is to identify the potential reliability issues of the components before they are used in the final product. The aging test equipment typically applies a controlled stress environment to the components and measures the changes in their performance, such as resistance, capacitance, and leakage current. The results of the aging tests are used to predict the lifetime of the components and to make improvements to their design and manufacturing processes.