Test / Inspection Equipment

Flying probe tester manufacturer and active test solution provider. FLYING PROBE TESTER, TROUBLESHOOTING TESTER, AUTO LCR TECHNIQUE

Peltier Socket Chamber Temperature Control System, Peltier Socket Chamber Test Rack, DRAM Test Constant Temperature Chamber,

Wafer Vision / Handler, Strip Level Inspection, Tape & Reel Vision / Handler

Laser Ablation System, TGV Laser Drilling Equipment, Wafer Laser Cutting Equipment, OLED Array Laser Repair System, IGBT Annealing Equipment, PERC Laser Ablation Equipment, Mini LED Rework Equipment

EUV HVM Reflectometer, EUV Accelerated Exposure Tool, Actinic Image Review System (AIRES®), EUV Pellicle Transmission Measurement System, EUV Pellicle High-Speed Mapping Tool, EUV N&K and Phase Measurement Tool, EUV Resist Outgassing Tool

Semiconductor and FPD Equip: Non-Pattern Surface Inspection System (WM series), Pattern Inspection System (Vi series), Bump Height Inspection System, TSV / Trench Depth Measurement System, Proximity Exposure System (TME series), Visual Inspection System.

Mask/LED/LCD/OLED Laser Repair. Atmospheric SEM, AVI (Auto Visual Inspection) for OLED, TFT AOI

SREM Scanning Reflection EUV Microscope, Ephase EUV mask phase measurement system, EUVPTR EUV pellicle transmission and reflectance measurement system, EMiLE EUV Micro-interference Lithography Equipment

OLED INSPECTION EQUIPMENT, LCD INSPECTION EQUIPMENT, WAFER LASER SAW, Probe (MEMS film type) OLED/LCD Probe Unit (MEMS film Type), Probe (Blade Type) OLED/LCD Probe Unit (Blade Type)

Real-time in-line monitoring of trace amounts of metallic contamination. Total solution of metallic, organic and ionic contamination monitoring for gases, chemicals and wafers in the semiconductor ecosystem

Wet Station, Ultrasonic Cleaner, Tube Cleaner and Parts Cleaner for semiconductor and FPD production parts cleaning equipment. Chemical Supply System

Semiconductor equipment and mobile phone manufacturing automation systems, robots for factory automation, equipment

THC (Temperature & Humidity Controller), Dehumidifier, CHR (Chiller)

AI Vision Solution, AOI Solution(DISPLAY/ Secondary Battery/ Semiconductor/ Automobile, etc.), LASER Solution

CHILLER, HEAT EXCHANGER, SCRUBBER, TEST CHAMBER. RETAINER RINGS and OTHER PROCESSING PARTS

FSH (Flying Over Scanning Holography) Module, Scanner, AOI System

Laser processing equipment for semiconductor, display, PCB

Memory Tester, Storage Tester, SoC Tester, Burn-In Tester

LED/OLED Equipment: Wireless logistics, Micro LED Chip AOI Inspector, Dispenser, PAD Cleaner, COG FOG AOI. Semiconductor: Mount Inspector, Wire Bonding, Die Attach, Wafer Warpage, WRS Inspector, STOCKER system, Wafer Edge, Macro Tower Lifter, STB, Rail.

Inspection Optic System, Inspection Review Optic system, Laser Repair Optic System, Wafer nano scratch inspection optic system