Other Test/Inspection Equipment

Assembly Automation Technology - dedicated to pick&place, test, inspection and tape&reel processes

Radio signal monitoring product

Laser Ablation System, TGV Laser Drilling Equipment, Wafer Laser Cutting Equipment, OLED Array Laser Repair System, IGBT Annealing Equipment, PERC Laser Ablation Equipment, Mini LED Rework Equipment

EUV HVM Reflectometer, EUV Accelerated Exposure Tool, Actinic Image Review System (AIRES®), EUV Pellicle Transmission Measurement System, EUV Pellicle High-Speed Mapping Tool, EUV N&K and Phase Measurement Tool, EUV Resist Outgassing Tool

Semiconductor and FPD Equip: Non-Pattern Surface Inspection System (WM series), Pattern Inspection System (Vi series), Bump Height Inspection System, TSV / Trench Depth Measurement System, Proximity Exposure System (TME series), Visual Inspection System.

SREM Scanning Reflection EUV Microscope, Ephase EUV mask phase measurement system, EUVPTR EUV pellicle transmission and reflectance measurement system, EMiLE EUV Micro-interference Lithography Equipment

OLED INSPECTION EQUIPMENT, LCD INSPECTION EQUIPMENT, WAFER LASER SAW, Probe (MEMS film type) OLED/LCD Probe Unit (MEMS film Type), Probe (Blade Type) OLED/LCD Probe Unit (Blade Type)

Real-time in-line monitoring of trace amounts of metallic contamination. Total solution of metallic, organic and ionic contamination monitoring for gases, chemicals and wafers in the semiconductor ecosystem

THC (Temperature & Humidity Controller), Dehumidifier, CHR (Chiller)

AI Vision Solution, AOI Solution(DISPLAY/ Secondary Battery/ Semiconductor/ Automobile, etc.), LASER Solution

FSH (Flying Over Scanning Holography) Module, Scanner, AOI System

Laser processing equipment for semiconductor, display, PCB

LED/OLED Equipment: Wireless logistics, Micro LED Chip AOI Inspector, Dispenser, PAD Cleaner, COG FOG AOI. Semiconductor: Mount Inspector, Wire Bonding, Die Attach, Wafer Warpage, WRS Inspector, STOCKER system, Wafer Edge, Macro Tower Lifter, STB, Rail.

Inspection Optic System, Inspection Review Optic system, Laser Repair Optic System, Wafer nano scratch inspection optic system

Hybrid-pixel X-ray and electron detectors

FPD equipment: Edge Grinder, Edge Profiler, Drilling Machine, Cover Glass Grinder, Mother Glass Grinder. OLED Inspection, Edge Inspection, Various AOI Inspection Equipment. Laser processing equipment. Semiconductor: Loader＆Unloader, FOUP Packing Machine.

Semicon process refractometers are for in-line concentration monitoring in bulk chemical and slurry delivery dispensing, and point-of-use blending, spiking, and polishing processes.

Wafer box, wafer carrier, wafer cassette, wafer carrier handle, RSP (reticle SMIF pod), RSP opener, mask case, chip tray, fluoro valves, cleanroom supplies, wafer and cassette cleaning systems

SIMPL- SEM Image Metrology PLatform, Process control monitoring : Image Quality (IQ), Process control monitoring : IC-Metric, Mask Data Preparation

Mass Spectrometers for in-situ Metrology