J.A. Woollam Co Ltd

 , US Manufacturer
Spectroscopic ellipsometry

Nova Ltd

 , IL Manufacturer
dimensional, materials, and chemical metrology solutions for advanced process control used in semiconductor manufacturing.

Scientific Computing International, SCI

 , US Manufacturer
advanced metrology systems and analysis software to major companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.

Radiant Technologies, Inc

 , US Manufacturer
Test equipment for ferroelectric materials of all types. PiezoMEMS Analyzer, Ferroelectric Tester.

Alemnis AG

 , CH Manufacturer
micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing environments.


 , TW Manufacturer
Semiconductor Assembly equipment, Sapphire Wafer Process Equipment, Precision mold & die parts manufacturing

Wuxi Lithography Electronics Co Ltd

 , CN Manufacturer,  Custom Manufacturer
Lithography equipment Process equipment, Testing Equipment, Photolithography Equipment, Sol wafer


 , JP Manufacturer
high-quality recorders, controllers, temperature sensors, various sensors, data loggers, infrared radiation thermometers, thermal image systems/thermographies, constituent/moisture/thickness meters, thyristor regulators, various testing systems

MTI Instruments Inc.

 , US Manufacturer
Semi-automated wafer measurement system for semi-conducting and semi-insulating materials

Kurabo Industries Ltd.

 , JP Manufacturer
Concentration meter, AVFI systems for HDI/Flex PCB, Infrared thickness meter.

Shimadzu Corporation

 , JP Manufacturer
Analysis/Measurement: Auger, X-ray, Surface Inspection/Flatness, SEM, ESCA, Film Thickness. Assembly/Hybrid Equipment: Base Loaders, Automation & Robotics. FPD Assembly Equipment: Liquid Crystal Injection, Lamination. Test/Measurement

MueTec Gmbh

 , DE Manufacturer
Semiconductor/MEMS metrology and inspection equipment.

E+H Metrology GmbH

 , DE Manufacturer,  Custom Manufacturer
Measurement tools for the Semiconductor and PV in process control and laboratory characterization. Contactless metrology tools for 1" up to 450mm silicon, quartz, sappphire wafers and plastic display materials.

Optosurf GmbH

 , DE Manufacturer
Optical surface measurement technology for measuring wafer roughness, waviness, and roundness of finely machined surfaces.

Automatic Research GmbH

 , DE Manufacturer
Equipment for printing electronics and thin functional films research. Semiconductor measurement and characterization equipment.

Kanematsu PWS Ltd

 , JP Manufacturer
Direct metal bonding system for IGBT module, Reticle mask stocker, Non-contact wafer thickness measuring system, Wafer transfer system.


 , US Manufacturer
Film thickness measurement, optical profiler, sheet resistance measurement systems.

Zhenjiang Chaona Subnano Instrument Co., Ltd

 , CN Manufacturer
3D Interferometry Microscope for sub-nanometer to millimeter surface profiling. Precision measurement for Semiconductor, MEMS, PV cell, Surface Engineering, OLED, etc.

MicroSense, LLC

 , US Manufacturer
Wafer geometry metrology systems, precision capacitive sensors, vibrating sample magnetometers and magneto-optical Kerr effect (MOKE) tools

Phys Development Lab Ltd

 , HU Manufacturer
Si PV cell characterization and measurement equipment.