Film Thickness; Uniformity Measurement; Ellipsometer

Spectroscopic ellipsometry

dimensional, materials, and chemical metrology solutions for advanced process control used in semiconductor manufacturing.

advanced metrology systems and analysis software to major companies in the semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries.

Test equipment for ferroelectric materials of all types. PiezoMEMS Analyzer, Ferroelectric Tester.

micro- and nanomechanical property measurement instruments that can be applied in a wide variety of testing environments.

Semiconductor Assembly equipment, Sapphire Wafer Process Equipment, Precision mold & die parts manufacturing

Lithography equipment Process equipment, Testing Equipment, Photolithography Equipment, Sol wafer

high-quality recorders, controllers, temperature sensors, various sensors, data loggers, infrared radiation thermometers, thermal image systems/thermographies, constituent/moisture/thickness meters, thyristor regulators, various testing systems

Semi-automated wafer measurement system for semi-conducting and semi-insulating materials

Concentration meter, AVFI systems for HDI/Flex PCB, Infrared thickness meter.

Analysis/Measurement: Auger, X-ray, Surface Inspection/Flatness, SEM, ESCA, Film Thickness. Assembly/Hybrid Equipment: Base Loaders, Automation & Robotics. FPD Assembly Equipment: Liquid Crystal Injection, Lamination. Test/Measurement

Semiconductor/MEMS metrology and inspection equipment.

Measurement tools for the Semiconductor and PV in process control and laboratory characterization. Contactless metrology tools for 1" up to 450mm silicon, quartz, sappphire wafers and plastic display materials.

Optical surface measurement technology for measuring wafer roughness, waviness, and roundness of finely machined surfaces.

Equipment for printing electronics and thin functional films research. Semiconductor measurement and characterization equipment.

Direct metal bonding system for IGBT module, Reticle mask stocker, Non-contact wafer thickness measuring system, Wafer transfer system.

Film thickness measurement, optical profiler, sheet resistance measurement systems.

3D Interferometry Microscope for sub-nanometer to millimeter surface profiling. Precision measurement for Semiconductor, MEMS, PV cell, Surface Engineering, OLED, etc.

Wafer geometry metrology systems, precision capacitive sensors, vibrating sample magnetometers and magneto-optical Kerr effect (MOKE) tools

Si PV cell characterization and measurement equipment.