The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam. Starting as a spin-off from the University of Nebraska, the company has rapidly grown to become a worldwide leader in spectroscopic ellipsometry. We have been perfecting our technology for over 30 years and have secured over 200 patents.
SPECTROSCOPIC ELLIPSOMETERS
M-2000
Rotating compensator technology. Many spectral ranges available up to 193-1690 nm.
RC2
Dual rotating compensator technology gives you the ability to determine all 16 Mueller Matrix elements.
iSE
Dedicated in situ instrument for applications that require real-time results.
theta-SE
Dedicated high-speed and compact mapping ellipsometer.
VASE
Variable angle spectroscopic ellipsometer with wide spectral range of up to 193-3200 nm.
alpha-SE
Spectroscopic Ellipsometry has never been easier! Simple, low cost system for measuring index and thickness. Spectral range of 380-900 nm.
IR-VASE Mark II
Covers a wide spectral range from 2 to 30 microns. This ellipsometer is used to characterize both thin films and bulk materials.
VUV-VASE
Spectroscopic ellipsometer covering the vacuum UV to the NIR. Perfect for lithography applications at 248 nm, 193 nm, and 157 nm. Spectral range up to 146-2500nm.
