Established in 1995 AFORE is a pioneer in the MEMS test equipment industry and offers a range of advanced test solutions for MEMS and other semiconductor devices, with the first wafer probe station for pressure sensors delivered in 2000.
The world’s only commercial Wafer-Level Chip Scale Packaging (WLCSP) MEMS test solution for motion sensors was introduced in 2007.
Since 2018 Afore is part of Singapore based AEM Holdings Ltd, a global leader offering application specific intelligent system test and handling solutions for semiconductor and electronics companies serving advanced computing, 5G and AI markets.
Today Afore’s solutions are used in development and manufacturing for automotive, industrial and consumer devices around the world.
Afore serves its global customers from its headquarters in Lieto, Finland.
WAFER AND FRAME PROBE STATIONS
We provide application specific test solutions based on several system platforms. This modular approach allows us to offer custom solutions at a reasonable cost and within a short time frame.
Our wafer and wafer-frame probe stations are optimized for test and calibration of a variety of MEMS and other semiconductor devices. The main benefits of our application specific test solutions are:
- Early device characterization at wafer level -> Faster time to market
- Improved quality control during wafer manufacturing -> Better yield and product quality
- Known good Die and quality binning during wafer sort -> Cost savings
- Final test of wafer level packaged devices -> Improved yield by eliminating pick and place operations
In addition to traditional wafer probing our systems also support final test of devices in Wafer-Level-Chip-Scale-Packages as well as other package types like QFN and BGA.