The Pressure Cooker test, also known as the High Temperature Operating Life (HTOL) test, is a test that simulates the thermal and mechanical conditions that packaged components and semiconductors might encounter in the field. In this test, the packaged component is subjected to high temperature and high-pressure conditions inside a pressure cooker. This test helps to determine the reliability of the packaged component and its ability to withstand the harsh environment, ensuring that the component will function as intended when deployed. The pressure cooker test is an important part of the qualification process for many types of semiconductors and other electronic components, helping to ensure their reliability and longevity in the field.