At the beginning of 2002, Walton Advanced Engineering, Inc., concentrates on the development of high density, thermally and electrically enhanced mBGA introduced and ramped up to mass production within very short time. The mBGA is a unique product for higher speed, larger memory capacity to fit high-end consumer electronics needs, such as for games- PS2, Rambus, DDR PC and Graphic applications.
Given the popularity of various consumer hand-held electronics, Walton Advanced Engineering Inc., has cooperated with strategic customers for MCP technology. The main one is to stack 2 or above dice into one laminated to effectively reduce the assembly space by more than 70% compared with traditional way. It is close to final qualification stage by customers and is expected to start mass production by the end of 2002.
In addition to traditional products such as PLC, QFP, SOP 330/450 mils, and TSOP II 300/400 mils in lead-frame solutions, Walton advanced Engineering offers an extensive set of products including LFBGA, TFBGA,VFBGA, Trench BG, and MCP that belongs to CSP laminate product series.
Walton Advanced Engineering Inc. test plant is equipped with comprehensive test functions. The product lines include memory test, burn-in, chips probe for 6 & 8" wafer and drop shipment to end- users. Owning close to 100 sets of advanced testers, such as Advantest T5592 could support to 4Gbit below memory size plus 1GMHZ speed and others like 5585, 5581, 5371 and 5365 series, total capacity is in leading edge in worldwide.
Supported memory products
Dynamic Rams- Static colume, Nibble mode, Page mode, Fast page, Hyperpage (EDO), SDRAM, DDR-SDRAM, FCRAM, mBGA and Rambus Statics Rams- SSRAM, PSRAM, VPSRAM, DPSRAM, Shadow RAM ROMs, EPROMs (Parallel), EEPROMs (Parallel) and Flash (Nor and Nand)
Utilize common testers to support different products - Dramatic investment reduction for customers
Product character test and analysis
Development, writing and converting of product testing program
Verification of the differences of varied test machine models
Improvement of testing yield by teamwork with customers
Reduction of testing time - cost savings for customers