Toray Engineering Co, Ltd
, JP Manufacturer
Semiconductor and FPD production equipment
Electron Beam Test Equipment
Electron beam test equipment is a type of automated test equipment used in the semiconductor industry to test the performance and functionality of electronic components, particularly image sensors. This equipment uses a beam of electrons to scan the surface of the image sensor, creating an image of the sensor's electrical characteristics, including its sensitivity, noise, and dynamic range. The data obtained from the electron beam test can be used to optimize the performance of the image sensor, identify defects, and ensure that it meets the required specifications. The electron beam test equipment typically consists of an electron gun, a scanning stage, and a detector system that records the electrical characteristics of the image sensor. The accuracy and resolution of the equipment are critical factors in ensuring the reliability and performance of the image sensor.