Wireless, non-contact test systems are used to test electronic devices and components without physically touching them. This type of test system is becoming increasingly popular as electronic devices and components are getting smaller and more complex. Non-contact test systems use technologies such as radio frequency (RF) or infrared (IR) to communicate with the device or component under test (DUT). The DUT can then be tested for a variety of parameters such as functionality, performance, and power consumption. This type of test system can also be used for production testing, where high-volume testing is required. Some benefits of non-contact testing include improved accuracy, reduced physical wear and tear on the DUT, and reduced test time.