Welcome to INA-TECH, a leading semiconductor equipment supply and management consulting company. We have been providing professional and differentiated consulting and supply management services that reflect the characteristics of our customers.
We provide excellent overseas cutting-edge technology at a reasonable price in Korea. If you contact us right away, we will reply in as much detail as possible.

Automated Testing Solution E-LIT(EMMI Thermal imaging microscope) E-LIT – Automated testing solution system allows non-contact failure inspection of semiconductor material during the manufacturing process. Inhomogeneous temperature distribution, local power loss can be measured with Lock-in Thermography. This is achieved by using the shortest measurement times combined with a high-performance thermographic camera and a specialised lock-in procedure. The power supply for this process is clocked with a synchronisation module and failures that produce mK or even μK differences are reliably detected. Smallest defects like point and line shunts, oxide failures, transistor and diode failures on a PCB surface and in IC´s can be detected and displayed in x and y positions. Additionally, it is possible to analyse stacked-die packages or multi-chip modules in z-direction with merely changing the lock-in frequency.


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