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Memory Tester
Storage Tester
SoC Tester
Burn-In Tester
Customer Service
Memory Tester
Memory Tester perfects products in their final stage by performing the final inspection on memory components and modules such as DDR4 and DDR5 during the post-process of semiconductor manufacturing while promoting yield management within the process.
i1000 Series
i1000 Series
Features
DDR4,5 Module Full Function Test and DC Test Support
Available TOF function up to 200MHz(cell & core test)
Per Site Operation Testing
Auto Calibration Support
SPD Function Support
Cycle Pallet All Pin Support
Specifications
Test Device
DDR4,5 Module / RDIMM, UDIMM, SODIMM
Max Frequency
1200MHz/2400Mbps
Parallelism
16para Multi-Site/Station
Digital Unit
2944Ch/System [Built-in “Per pin” PMU]
Power Unit
PPS - 640Ch/System, VPMIC - 16Ch/System (High Voltage & High Current)
Cooling Method
Liquid cooing
Operating System
Linux
i7000 Series
i7000 Series
Features
DDR4,5 Component Full Function Test and DC Test Support
Available TOF function up to 200MHz(cell & core test)
Per Site Operation Testing
Auto Calibration Support
Cycle Pallet All Pin Support
Specifications
Test Device
DDR4,5 Component
Max Frequency
1200MHz/2400Mbps
Parallelism
512para/Station
Digital Unit
5888Ch/System [Built-in “per pin” PMU]
Power Unit
PPS - 1280Ch/System
Cooling Method
Liquid cooing
Operating System
Linux
