X-ray Equipment

Hybrid-pixel X-ray and electron detectors

Semiconductor front end metrology equipment: optical metrology series for film thickness & properties, and optical critical dimensions; plus X-ray metrology series for film thicknesses, material properties and compositions, surface contamination.

X-ray and CT Systems, Laser Radar Measuring Systems, 3D Laser Scanners, CNC Video Measuring Systems, Optical Manual Measuring, Industrial Microscopy

automatic vision inspection that is dedicated to Semicon backend front of line operations. We have the world's first 3D inspection running in mass production.

X-ray intelligent testing equipment for semiconductor and SMT.

Products used for dispensing adhesives, coatings, sealants, biomaterials and other materials; for fluid management; for test and inspection; and for UV curing and plasma surface treatment.

metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology for the Semiconductors industry.

High definition non-destructive control systems for the microelectronics industry.

Optical emission spectrometers, x-ray diffractometers and x-ray fluorescence instruments.

automated optical and X-ray inspection system for printed circuit board assemblies (PCBA), semiconductor package, or power module

FPD Equipment:vacuum assembling (SE-LCASV), panel misalignment inspection, Wafer vacuum assembling equipment, X-ray bump/void inspection equipment, Macro inspection equipment, LASER debonding and cleaning equipment, Nanoimprint equipment.

Analysis/Measurement: Auger, X-ray, Surface Inspection/Flatness, SEM, ESCA, Film Thickness. Assembly/Hybrid Equipment: Base Loaders, Automation & Robotics. FPD Assembly Equipment: Liquid Crystal Injection, Lamination. Test/Measurement

X-ray systems and applications services to the electronics manufacturing industry. X-ray systems for wire bond inspection and failure analysis.

Plasma assisted etch and deposition solutions. Failure analysis tools. Inspection and process control equipment.

Industrial X-ray inspection system and SEM (Scanning Electron Microscope). Flip chip bonder, TAB IC potting system.

Advanced packaging inspection and metrology

Compact Light Source (CLS), a miniature synchrotron x-ray source

X-RAY system for Electronics, Automotive, Semiconductor, LED, Battery.

Manufacturers of X-ray analysis, thermal analysis and non-destructive testing instruments.

Process equipment and metrology systems for current and future semiconductor manufacturing processes. Metrology, cryogenic cleaning, photomask repair systems. X-ray defect inspection and metrology equipment.