Parametric Test Systems

Parametric electrical tests (E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal tests, assembly and packaging services, probe cards, load boards, test interfaces and sockets.

DYNAMIC CHARACTERISTIC TEST SYSTEM, THERMAL RESISTANCE TEST SYSTEM, STATIC CHARACTER TEST SYSTEM, IPM/IGBT TEST SYSTEM, DIODE TEST SYSTEM

Pulse generator, amplifier, pulsed laser diode driver, semiconductor device testers

Reliability Test Equipment, Fixtures, Solutions and Services for the Semiconductor industry.

Strip test handlers, film frame handlers, and strip laser marker for the semiconductor industry.

Semiconductor testing equipment

Production equipment and automation equipment for semiconductors, crystals, LCDs, FILMs, and optical parts.

IGBT and MOSFET Testing Solutions, Power Semiconductor Automatic Testing Line, Power Semiconductors Testers for Maintenance

Semiconductor Curve Tracer, B-H Analyzers, Isolation System, Oscilloscopes, Isolatoin Probe, Oscilloscope Accessories, Delay Pattern Generator (six-channel pulse generator), Signal Generators, Universal Counters

Manufacturer of top-performance manipulators, docking/interfacing equipment, and handling systems, plus system integration + automation specialist

Test, analysis, and repair of IC probe cards, metrology and inspection solutions for industry. Solutions for dynamic testing of power semiconductors.

ATE Semiconductor test system, Test Measuring Instruments (TMI) for Audio/Video/Comunication & Broadcast, contract design and manufacturing of electronic systems.

Test equipment for MEMS, sensors and semiconductors.

Power discrete and analog IC ATE (Automatic Test Equipment)