We focus our power in the Reseach and Development as the Semiconductor test equipment manufacturers.
The core of technology is Semiconductors. In order to test this Semiconductor, it is necessary to have highly accurate test equipments.
We are the group of intellectuals to design and develop such semiconductor test equipment. Due to the rapid growth in technology, the need for semiconductor test equipments is drastically increasing both in the domestic and overseas. In order to respond speedily, we continue to adapt the latest electronic design with CAD technology and achieve highly accurate development and design. Further, with the standard calibration and testing techniques, the Quality control is achieved prior to delivery.
With such an approach, we, CATS retained the credibility with both japanese and overseas customers with our original brand.
DEVELOPMENT&DESIGN
Maximum intelligence with limitted intellectuals as motto.
Full pledged design and development by CAD.
The core of technology is Semiconductors. In order to test this semiconductor, it is necessary to have highly accurate measure-ment equipments. In turn, this needs a high level Engineering. Of course, in CATS, we design and develop the test equipments to satisfy the varying needs of both the Japanese and overseas customers.
In order to produce the test equipments to test such high technology, it calls for the accurate and high speed starting from the design stage, In order to respond such needs, we have arranged the latest technology CAD and achieved the highly accurate design. To make the multifunction and easy operation equipments, we have put equal importance for the software design too.
For the personnel environment, our motto is "maximum intelligence with limitted intellectuals". Each employee is educated with an excellent environment to become an intellectual personal service. With such an environment, the designed ideas have become the CATS original brand.
TUNING&QUALITY CONTROL
In order to deliver a complete semiconductor equipment,
the experience and achievement of our engineers resulted in the victory.
The just completed product may be considered as "Semi-manufactured goods". People are also considered as "Being a fledgling".
The "semi-manufactured goods" are calibrated and tested with the long experience and achievement. Like, we, people becoming "a complete person" with severe test, the semiconductor equipment too will become "a complete product" by getting tested at various angles.
But, these are again tested with strict quality control and the standards of testing. Further, only the products which pass the quality standards are shipped.
The technical documentation is different for each customer. To use the test equipments properly, it is necessary to supply proper documentation. To do this, DTP system is adapted and the management of technical specifications, instruction manuals etc are properly done.
We don't have any compromise to meet the quality standards. As we believe in achieving the quality, we have retained the credibility with our customers.
DYNAMIC CHARACTERISTIC TEST SYSTEM
Lined up for various uses from production to development and evaluation.
Aims for developing products corresponded to universal environment
with high voltage, high current, and high speed.
Evaluation system with measurement temperature from -60℃ to 300℃ is developed.
Rich experiences for new materials such as SiC and GaN.
SWITCHING TIME TESTER [MOS-FET, IGBT]
SWR330A
SWR330A
SWR330A has been designed to measure resistive load switching time for MOS-FETs and IGBT. It judges the go/no-go by taking in a digital oscilloscope waveform by corresponding with software.
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SWITCHING TIME&QG TEST SYSTEMb[MOS-FET, IGBT]
SWQR550
SWQR550
SWQR550 has both function of resistive load switching time and gate capacity (QG) measurement. However, it can not measure resistive load switching time and gate capacity consecutively because each measurement characteristic is respected.
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SWITCHING TIME TEST SYSTEM [MOS-FET, IGBT]
SWS1240ZZF
SWS1240ZZF
SWS1240ZZF has been designed to test switching characteristics and energy tolerance at short circuit that are by IGBT inductive load. This model can test 6 devices at maximum.
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SWITCHING TIME TEST SYSTEM [MOS-FET, IGBT, DIODE]
SWS1530ZZ
SWS1530ZZ
SWS1530ZZ has been designed to test short circuit tolerance and switching characteristics of IGBT, MOS-FET and DIODE. It is possible to test automatically with temperature environment of -40℃～175℃, and from low breakdown voltage to high breakdown voltage area.
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di/dt TESTER [MOS-FET, DIODE]
GST650Z
GST650Z
GST650Z has been designed to seek and judge di/dt characteristic with software by using reverse recovery waveform of MOS-FETs and diodes or break waveform with digital oscilloscope. It has OPEN/SHORT test and driver check functions to improve reliability.
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INDUCTIVE LOAD TESTER (Included leakage current test) [MOS-FET]
LVNI20ZFCA
LVNI20ZFCA"
LVNI20ZFCA is inductive load tester for MOS-FET, which system is for a measurement with a wafer condition. This system is equipped with high speed interception circuits at a chip destruction, and has IGSS and IDSS measurement circuits for leakage measurement before and after L load measurement.
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INDUCTIVE LOAD TESTER [TRANSISTOR, MOS-FET]
LVTG20Z
LVTG20Z"
LVTG20Z is designed to guarantee the energy limitation to switching at the inductive load of TRANSISTOR and MOS FETs by turn off waveform voltage and current area. This tester can measure the close tolerance of each points by the clamp voltage.
