NanoSystem Co., Ltd. is the world-class 3D measurement & inspection solution provider. Since its inception in 2003, NanoSystem has provided 3D measurement & inspection systems for the semiconductor and display industries and has successfully expanded into overseas markets as well as the Korean market through continuous research and development in its business field, establishing itself as a reliable solution provider. In an effort to meet the needs of customers, all employees of NonoSystem are working hard to create value for customers as their partners mainly through business innovation, technology development, talent development and cost saving. In addition, NanoSystem will strive to become the leading company that provides the greatest satisfaction for customers by meeting their needs in this rapidly changing market environment of the 21st century. NanoSystem will continue to create the greatest value for customers and pursue maximum customer satisfaction, making it a top priority to keep its promise to customers, so as to repay the trust placed in us by shareholders and evolve into the high-performing top-notch company on the global stage.

The NanoSystem measurement systems are mainly based on the White Light Scanning Interferometry (WSI) and Phase Shifting Interferometry (PSI).  With those technologies, NanoSystem designs and builds their 3D optical surface profiler.  Typical parameters like roughness, step-height, flatness, parallelism and spherical measurement are standard with NanoSystem’s NanoMap S/W package.


3D Optical Surface Profiler provides simple operation and amplifies customer’s convenience.  NanoSystem’s NV-Series offers the solution of every existing surface measurement for R&D and production. It will accelerate the quality of your technology and products.  They provide the most advanced metrology in the world for your various researches with automatic functions.  The Profiler can be used for In-line measurement/inspection with an integrated large stage and automatic system to manage the produce, quality, yield rate.

The new NanoSystem NS-W1000 is a large area WSI surface profiler.  It combines the typically WSI very high vertical resolution with a very large area up to 21.7 mm x 16.3 mm.  This allows high-precision and fast measurements of large surfaces without stitching.

NVM and NVH Series
High-Density Substrate Measurement System NVM-Series is the fastest and most accurate instrument for HDI PCB inspection and measurement. It will help to increase the yield rate and quality of your product as best as it can be.

While the NVM series is a fully automated 3D surface measurement system, is the NVH series an automatic hybrid system to measure 3D and also 2D parameters.

CylinderScan and CylinderInspector
CylinderScan Series

The topography of the cylinder surface is one of the most important factors to control oil consumption, fuel consumption, longevity and wear of engines, to enhance the surfaces, the CylinderScan is a reliable method to characterize them as well as to measure the most critically honing structure parameters.

The CylinderScan combines exceptional non-destructive profiling performance and operator convenience.  Besides evaluation ISO roughness values, employing white-light-interferometry, this compact system can measure 3D surface topography from nanometer-scale roughness with sub-nanometer resolution and production level throughput.

It allows measuring cylinder bores from 70 mm to 160 mm in diameter.  It is fully automated with a handful of recipe functions (radial, axial).


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