Probe Cards; DUT boards and other probing accessories

Wafer Vision / Handler, Strip Level Inspection, Tape & Reel Vision / Handler

OLED INSPECTION EQUIPMENT, LCD INSPECTION EQUIPMENT, WAFER LASER SAW, Probe (MEMS film type) OLED/LCD Probe Unit (MEMS film Type), Probe (Blade Type) OLED/LCD Probe Unit (Blade Type)

Burn-in Testers and Burn-in Boards

High quality, custom designs, from production test, burn in custom cards to DVT ( Design, Verification Testing)

Contact Probes, Probe Cards, Special Contacts

Probe Cards. WAFER PROBING TEST: Vertical Cantilever, Epoxy Cantilever, MEMS Cantilever. PACKAGE PROBING TEST: PCB Test Jig/Fixture, DDIC Package Test

Memory Probe Card, Non-Memory Probe Card (logic, RF, Low Leakage), Sockets (MEMS BGA, Hybrid), Test Interposer

Probe cards and testing solutions for semiconductor chips

Prober related products, automation design integration solutions, DRAM foundry testing services and Probe Cards, including semiconductors

SPRING PROBE PIN, POGO, TEST SOCKET, COAX SOCKET, BURN IN TEST SOCKET, WIRE PROBE, ONE PIECE SPRING PROBE PINS, MANUAL LID,

Semiconductor probing device and related components

Probe cards: MEMSFlex™ Direct Dock, Trio™ Vertical, Vertical Space Transformers, CMOS Image Sensor, LCD Driver, Venture™ Cantilever, Ceramic Blade Cards, MetrologyB3™ Vertical Probe Cards

Parametric electrical tests (E-test), wafer-level and package-level reliability (WLR & PLR), mixed signal tests, assembly and packaging services, probe cards, load boards, test interfaces and sockets.

Semiconductor test probe card parts, components, and consumables

Load Board for IC test, probe PCB for wafer test, substrate for vertical probe card and DUT board for memory test.

IC substrates and HDI PCB. Large semiconductor packaging substrates, Multilayer PCBs for ICT infrastructure devices such as supercomputers and high density HDI PCBs for edge devices such as in-vehicle equipment.

Probe cards, test sockets, different types of microchip and electronic components test equipment to conduct tests and measurements under various conditions.

Provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.Probe Systems, Probes, Probe Cards, Metrology, Quantum Cryogenics.

Electronic test and measurement equipment.

Design and production of probing and inspection systems to the semiconductor industry.