Founded in March 2017 and based in Grenoble (France), Hprobe is a spin-off company of SPINTEC (one of the leading spintronics research laboratories worldwide) and benefit from many years of research in the field of magnetic testing.

Hprobe is today able to offer a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing.
Current product line includes dedicated tools for characterization and testing of MRAM (STT, SOT, VCMA) and Magnetic Sensors (TMR, GMR, etc.) in all phases of the magnetic technology development.
The company is currently working with all major foundries worldwide involved in the manufacturing of MRAM devices.

Magnetic Automated Test Equipment 
Magnetic devices need to be tested under magnetic field sweep, and time spent to test wafers increases chip costs. Varying the magnetic field at a high sweeping rate above the wafer is a challenge for industrial high-volume markets.

The key purpose of Hprobe’s products is to electrically probe wafers under a magnetic field at extremely high throughput, by achieving fast testing time per device. This is possible thanks to Hprobe’s proprietary technologies of magnetic field generators.

Hprobe’s 3D magnetic field generator and Hcoil-2T magnetic field generator are patented technologies, compatible with the requirements of electrical wafer level probing requirement in mass production. The uniquely designed generators operate with power supplies and air cooling, so no complex liquid cooling is required.

Hprobe testers are operating with 100-300mm automated wafer probers. A test head integrating the generator is positioned on the wafer probing station. The testers are compatible with automatic probing stations from:

TEL (Tokyo Electron Limited)





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