OKOS offers innovative Scanning Acoustic Microscopy solutions for Semiconductor and Industrial NDT companies all over the world, by understanding and responding swiftly to each and every customer need.
Since 2005 this customer focused tunnel vision has led us to take on the difficult, hopeless issues that others avoid. Our engineers collaborate with you to understand, clarify and pinpoint needs. Then we craft solutions to transform your operations and throughput.
OKOS offers over 15 flexible and ready-to-use systems and components. Because we make more than 90% of our parts, we provide exceptional quality, precision and value. With locations across North America, Asia and Europe, our local experts are ready to serve you.
Solar Panel Inspection Scanner: MACROVUE-P Series
Custom engineered for inspecting Solar Panels, MACROVUE accommodates all size panels,
and allows detection of:
Bond integrity between glass and PV material
Water ingression into PV module
Bonding between glass and buss bar
Semiconductor Package Failure Analysis
voids . disbonds . cracks . delamination . internal defects
Starting in 1998, OKOS has developed breakthrough SAM technologies that are in many systems all over the world.
Since 2005, OKOS has grown year over year and currently maintains operations and customers throughout North America, Asia and Europe.
Through our proprietary architecture, we are the premier solutions provider of SAM systems and instrumentation worldwide.
Some of our key contributions to OEM customers and end-users are:
- Multi Zone Inspection (SALI)
- 1 GHz and 3 GHz Digitizers
- Dual Phase Inversion and PCM Techniques for Delamination
- Dual Channel Scanning Systems for high throughput
- Real-time Frequency Imaging
