Hitachi, Ltd. provides information technology, energy, industry, mobility, and smart life solutions in Japan and internationally. The company offers systems integration, consulting, and cloud services, as well as servers, storage products, software, telecommunications and network equipment, and ATMs; industrial machinery and plants, elevators, escalators, and railway systems; thermal, nuclear, and renewable energy power generation systems; and transmission and distribution systems. It also provides semiconductor processing equipment, test and measurement equipment, industrial products, and medical electronics equipment; and semiconductor and display related materials, circuit boards and materials, automotive parts, energy storage devices, specialty steel products, magnetic materials and applications, and functional components and equipment, as well as wires, cables, and related products. In addition, the company offers hydraulic excavators, wheel loaders, and mining machinery; and engine and electric powertrain systems, and integrated vehicle control systems. Further, it provides air-conditioning equipment, room air conditioners, refrigerators, and washing machines. Hitachi, Ltd. has a collaboration with Centre Leon Berard and Renesas Electronics Corporation; and a strategic alliance with Microsoft Corp. to advance digital solutions for the manufacturing and logistics industries in Southeast Asia, North America, and Japan. The company was founded in 1910 and is headquartered in Tokyo, Japan.


Semiconductor Manufacturing Equipment TOP

Etch, CD-SEM and Defect Inspection Systems

Dry Etch Systems
Conductor Etch Systems
Production Support Program
CD-SEM & Defect Inspection
Design Based Metrology System
Defect Review SEM
Wafer Surface Inspection System
Field Solutions

Uniformized Electric Field Wafer Holder
HDD capacity increasing and Mirroring modification
FAPC(Linux)FAPC(Linux) upgrade
Data Station for CD-SEM
Terminal PC
Index by device

Offline Analysis

Field Emission Scanning Electron Microscopes (FE-SEM)
Transmission Electron Microscopes (TEM)
Pre-processing of Sample for TEM/SEM
Nano-Probing Systems
Atomic Force Microscopes (Global site)


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