Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better quality products and getting them to market faster. Our focus is on creating innovative, customer-focused solutions and services to enhance efficiency and deliver tangible economic impact through chemical, physical and structural analysis of materials.
Underpinned by extensive industry knowledge and technical and applications expertise, Malvern Panalytical instruments are designed to help users better understand a wide variety of materials, ranging from proteins and polymers, particle and nanoparticle suspensions and emulsions, through to sprays and aerosols, industrial bulk powders, minerals and high concentration slurries, and solids, such as metals and building materials, plastics and polymers.
Our technologies enable the measurement of parameters including particle size, shape and concentration, chemical identity, zeta potential, protein charge, molecular weight, size and structure, biomolecular interactions and stability, elemental concentrations and crystallographic structures. Highly reliable and robust characterization of these properties is fundamental to predicting how a product will behave during use, to optimizing its performance and achieving manufacturing excellence.
Malvern Panalytical was formed by the merger of the businesses Malvern Instruments and PANalytical, including the companies ASD and Claisse, on 1st January 2017, and employs over 2,000 people worldwide. The combined entity is a strong player and innovator in the materials characterization market and will leverage the strengths of the individual companies in their end markets, ranging from building materials to pharmaceuticals and from metals and mining to nanomaterials. Applications laboratories around the world and a global sales and service presence supported by a strong distributor network ensure unrivalled levels of customer support.
Malvern Panalytical is part of Spectris plc , the productivity-enhancing instruments and controls company.
The advancements in materials research and semiconductor technology have brought great changes to the way we live. They have driven developments in almost every aspect of our daily life – phones, smart wearables and toys, laptops, wireless networks, home infotainment systems, cars, and smart meters.
The electronic display, data storage, and RF filter technology industries have rapidly advanced, and the rate of change continues to follow Moore’s law. Growth technologies now allow the deposition of multilayered structures with individual layers exhibiting film thickness from microns down to monolayers.
Typical materials involved in advanced thin film devices are semiconductors, metal alloys, dielectrics, oxides, and polymers. This mandates accurate monitoring and control of the device parameters using multiple investigation techniques. Equally important is the fine control over the process materials, like CMP slurry, which is an indispensable part of any thin-film device manufacturing.
Thin film-based devices are usually manufactured using a complex multistep fabrication process. X-ray fluorescence (XRF) and X-ray diffraction (XRD) are an integral part of any such manufacturing process to monitor and control critical thin film parameters at every step. Electronic displays employ various technologies such as liquid crystals, pigment dispersions, quantum dots, and OLEDs. In most of these, the particle size and shape play an important role and need reliable characterization. In OLEDs, strict control over the polymer characteristics such as size and molecular weight is paramount to the display quality.
Analytical solutions for the electronics industry
Malvern Panalytical is closely associated with the electronics industry with a wide range of solutions across the entire value chain:
XRF (2830 ZT) delivers thickness and composition information for a wide range of thin films, with contamination and dopant levels and surface uniformity on wafers up to 300mm in size.
XRD (X'Pert3 MRD and X'Pert3 MRD XL) provides absolute, calibration-free, and accurate information on crystal growth, giving material composition, film thickness, grading profile, and phase and crystal quality.
Laser diffraction (Mastersizer 3000) measures particle size distribution in powder and slurry dispersions, e.g. CMP slurry and electronic display materials.
Imaging (Morphologi 4) analyzes particle shape and morphology using automated imaging.
Zeta potential (Zetasizer Range) determines the stability of slurries used in the electronics industry through the measurement of zeta potential. It also measures particle size in nano-particle suspensions.
GPC/SEC (OMNISEC) analyses size, molecular weight, intrinsic viscosity, branching, and other parameters for polymers used in the electronics industry.
XRF (Epsilon 4): A chemical composition analysis of raw materials and finished products and RoHS/WEEE analysis of electronic components.
XRD (Aeris): A crystalline phase analysis of raw materials and finished products in electronics industry.
Advanced semiconductor thin film metrology tool
The improved X’Pert platform
Industry-leading particle size analyzer
Nanoparticle and zeta potential analysis
GPC/SEC solution for the measurement of absolute molecular weight, intrinsic viscosity and other Polymer parameters.
Benchtop XRF for chemical composition and impurity analysis
Compact XRD to measure crystallite size and crystal phase
Particle shape analysis with high statistical accuracy